Device characterization tests with 4200A-SCS and Lakeshore probe station

We have a 4200A-SCS connected with a lakeshore probe station, where we can test our SiC/GaN dies through Clarius software. There we can perform I-V test, threshold voltage etc. in low voltage (-210 to 210 V) and low current setting (-0.105 to 0.105 A). Now for some new device testing, we need to increase the voltage and current setting (up to 650 V, 50 A). Can we integrate the 2657A (HV SMU) and 2651 A (HC SMU) with the existing 4200A for probe station testing?

Short answer is yes.
But a lot of details to manage including safety interlocks, common LO,  and over voltage protection for the 4200A from the 2657A.

Is your Lakeshore capable of the HV and the current densities of the 50Amps?  Or you will have different probe station for the new high power IV tests.

I suggest you get in contact with your local Keithley FAE for detailed discussion and configuration.
Are you located in Nebraska?

Hi Andrea, thanks for your response. Yes, I am from the University of Nebraska-Lincoln. Can you please provide the contact address for local Keithley FAE?