• KickStart trial corrupted and lost with change to PC clock

    My company recently purchased a new SMU for diode testing. We are using the KickStart program for some testing with the I-V Characterizer.
    The laptop has not been updated and believed the date was 1/9/2020. I updated the clock to today and this caused the trial to expire.
    I tried to move the date back to 1/9/2020, but now KickStart says the clock was tampered with.

    Is it possible that I can have another trial license?
  • RE: What’s the difference between the Datalogger and the DMM option in KickStart?

    KICKSTARTFL-DL is the license for the Data Logger App in the KickStart 2 software.

    This app is used with our data acquisition units (i.e. DAQ6510, 3706A) when using the switch cards, typically via the rear panel.

    This app allows for multi-channel switching on supported instruments and will perform measurements dependent on your test settings.

     

    KICKSTARTFL-DMM is the license for the DMM App in the KickStart 2 software.

    This app is used with measurement units, including our suite of DMMs, our data acquisition units which have a single input terminal available (i.e. DAQ6510 front panel) and our sensitive products (i.e. electrometers and picoammeters).

    Generally, These are instruments or operation modes that are a single input and do not include source capabilities (outside internal sources associated with resistance measurement functions).

     

    Both of these Apps will perform measurements and will log data over time.

    The apps are largely separated by their supported instruments (listed on the KickStart landing page) and intended application/purpose (data logger app for 'switching' and dmm app for single input).

    You can find more information about KickStart here: https://www.tek.com/en/products/keithley/keithley-control-software-bench-instruments/kickstart
  • What’s the difference between the Datalogger and the DMM option in KickStart?

    what’s the difference between the Datalogger and the DMM option?
    Datalogger for the back side of the DAQ and DMM for using the ports at the front panel?
    Or is it there is no recording function for the DMM option?
  • RE: 2400 SMU range compliance

    Hello,

    These are the differences between 'real' compliance and range compliance:

    When in real compliance, the source clamps at the displayed compliance value. For example, if the compliance voltage is set to 1V and the measurement range is 2V, output voltage will clamp at 1V. In this case the "CMPL" annunciator will flash.

    When in range compliance, the source output clamps at the maximum compliance value for the fixed measurement range(not the compliance value). For example, if compliance is set to 1V and the measurement range is 200mV, output voltage will clamp at 210mV. In this situation, the units in the compliance display will flash. For example, with the following display

    Vcmpl:10mA, the "mA" units indication will flash.

    Since the :MEASure:[FUNCtion]? command is a less precise measurement command, I would recommend configuring your desired settings and then using the :TRACE subsystem to report the recorded data.
    The manual has more information about each command subset and additional operation information:
    https://www.tek.com/en/keithley-source-measure-units/keithley-smu-2400-series-sourcemeter-manual/series-2400-sourcemeter
    You can also find an example below, configuring a sweep and performing measurements at the fastest rate available. This demonstrates configuration of manual ranges and the Trace system:

    *RST
    :SOUR:FUNC:MODE VOLT
    :SOUR:LIST:VOLT 1,0,-1
    :ARM:COUNT 1
    TRIG:COUN 100
    :TRIG:DEL 0.0
    :SOUR:DEL 0.0
    :SOUR:VOLT:RANGE 1
    :SENSE:CURR:PROT 1e-3
    :SENSE:FUNC:CONC OFF
    :SENSE:FUNC 'CURR'
    :SENSE:CURR:RANGE 1e-3
    :SENSE:CURR:NPLC 0.01
    :SENSE:AVERAGE:STAT OFF
    :DISP:ENAB OFF
    :SYSTEM:AZERO:STAT OFF
    :TRAC:CLE
    :TRAC:POINTS 100
    :TRAC:FEED SENSE1
    :SOUR:VOLT:MODE LIST
    :TRAC:FEED:CONT NEXT
    :OUTPUT ON
    :INIT

    Now wait until the sweeps complete. Then send
    :TRACE:DATA?
    Now read the data.
    You will see the timestamps show about 1msec per point.
    This is the fastest voltage sweep the Model 2400 can do.
    Please review all commands and their function in the manual before running a test to ensure they provide the desired operation.
  • RE: How can I perform battery simulation with the 2281S?

    You can perform battery simulation directly on the 2281S and generate charge models using the unit. The manual provides complete instructions and capabilities:
    https://www.tek.com/en/tektronix-and-keithley-dc-power-supplies/2281s-manual/series-2281-precision-dc-supply-and-battery

    We do provide software options for generating and running simulations.
    Our KickStart software has a Battery Simulator Specialty Application that will allow you to create a model using the 2380 Series electronic loads and then run your simulation on the 2281S. You can find More information on the KickStart landing page:
    https://www.tek.com/en/products/keithley/keithley-control-software-bench-instruments/kickstart
    You can also find a video showing the software in use here: 
    https://www.tek.com/en/video/product-demo/how-to-use-keithley-kickstart-battery-simulator-app

    If you have used our graphical TTI Source Measure Units in the past to generate your models, such as the Model 2450, you can use the script attached.
     
  • How can I perform battery simulation with the 2281S?

    I have a Model 2281S from Keithley and want to know how to perform battery simulation.
    Also, how can I generate new models?
    And is there software available for this?
  • RE: 6485 data overflow

    Overflow is a condition where the input signal from the device under test exceeds the range or measurements capabilities of a particular instrument.
    If you are encountering overflow, I would recommend increasing the range for that measurement to appropriately capture the desired reading.
    If you find that overflow on a previous reading/channel is impacting the results recorded on a subsequent channel, I recommend checking the functionality of the channel against a known value (i.e. power supply static voltage source, resistor, etc).
    If the channel is operating within specification, this may be an anomalous reaction to the overflow or could be due to a relative measurement configured via other settings of your test.
    Can you elaborate on what you find when the values 'become large'?
    This will help to better resolve the issue you're encountering. As much detail possible regarding your test, DUTs, settings and readings would be helpful.
  • RE: DAQ6510 continue mode by TCP

    Hello,

    Continuous Trigger mode is only available via the front panel, not remote operation.
    When remote programming, we would recommend developing a trigger model that will provide more control over the buffer and operational details of your test. You can use an infinite trigger, if you prefer, to continually record data in a similar fashion.
    Continuous Trigger mode is designed for data reference as a bench instrument and is not compatible with programming or remote operation.
  • RE: DAQ6510 Data Logging

    The DMM6500 and DAQ6510 operate the same way, in general.
    The front panels of each will operate like a standard DMM with single input to a single A/D converter.
    The sample rate, determined by several settings, will govern the measurement speed on each channel (either front panel or at each channel on a switch card).
    The scan rate will determine how quickly each channel will change/switch. This only governs the channel switching, not the measurement itself.
    To achieve a desired 'total rate' you would need to account for the sample rate of the measurement and the scan rate of the switch card/relays.
    Multiplexers operate in a sequential switching configuration, so you would follow a sequence like the one below:
    CH1 close + measure > CH1 open > CH2 close + measure > CH2 open > CH3 close + measure >......
    Here, you'll find the scan rate will impact the open-close portion of the operation and the sample/measure rate will impact the measurement once the channel is closed/selected.
    You will need to refer to the datasheets for each of the instruments and the switch card to determine specific rate specifications:
    https://www.tek.com/en/datasheet/dmm6500-6-1-2-digit-bench-system-digital-multimeter-datasheet
    https://www.tek.com/en/datasheet/daq6510-data-acquisition-and-logging-multimeter-system-datasheet

    The instrument uses an analog input for the signal from your DUT.
    It will then be processed through an A/D converter for reporting as a reading.
     
  • RE: Keithley 590 C-V Analyzer: Applying the Calibration Capacitor Correction

    Is it correct that this question is more closely related to connection compensation (in this case a load) for the model 590?
    There are basically three components to this process:  open, short, and load connection compensation measurements. 
    It seems you can't proceed with the load (known capacitance) compensation because the reading is invalid. 
    How did the open and short measurements go?  What are the connections like?

    Is your 590 is in calibration?  If not, I would recommend calibration for the unit.  This may resolve some of the issues you are facing.